MOS晶体管的阈值电压不匹配特性

集成电路中器件的匹配性对于模拟电路和数字电路的设计有着很重要的影响,而现在重要的是还缺乏精确的器件匹配的模型。在模拟集成电路设计中,MOS管阈值电压的匹配特性对集成电路尤其是电流Ids的大小有着重要的影响。基于短沟道系列模型,MOS氧化层中的固定电荷和杂质原予服从泊松分布,分析了NMOS和PMOS器件不匹配的物理原因,并验证σVT/VT遵循与1/(?)成比例的结论。     

Thermal Monitoring of Self-Checking Systems

With the increasing power density in integrated systems resulting from scaling down, the occurrence of field failures due to overheating has considerably increased. Faulty operation can be prevented by on-line temperature monitoring. This paper deals with questions of on-line temperature monitoring in safety-critical systems. First the possible temperature sensors are reviewed and basic principles of self-checking systems including such sensors are detailed, then a new temperature sensor cell with extremely good parameters designed especially for DfTT applications is presented. The basic questions of integrating thermal sensors into self-checking systems are also discussed.     

Shorts in self-checking circuits

It has been noted by several authors that the classical stuck-at logical fault model might not be an appropriate representation of certain real failures occurring in integrated circuits. Shorts are an important class of such faults. This article gives a detailed analysis of the effects of shorts in self-checking circuits and proposes techniques for dealing with them. More precisely, we show that, unlike other faults such as stuck-at, stuck-on, and stuck-open—which produce only single errors in the place they occur—shorts can produce double errors on the two shorted lines. In particular, feedback shorts can produce double errors on the two shorted lines. The double error is unidirectional for some feedback shorts and non-unidirectional for some others. Furthermore, in some technologies (e.g., CMOS), non-feedback shorts can also produce double non-unidirectional errors. We also show that unlike stuck-at, stuck-on, and stuck-open faults, redundant shorts can destroy the SFS property. Then we propose several techniques for coping with these problems and we illustrate the results by circuit implementation examples.The present study is given for NMOS and CMOS circuits but we show that it is valid for any other technology.     

Nd:YAG激光器电光Q开关电路的实验研究

本文报导用于重复频率为40ppsNd:YAG激光器电光Q开关的二种驱动电路的设计和实验研究,并比较了这二种Q开关电路的实验结果.     

MetateM: An introduction

In this paper a methodology for the use of temporal logic as an executable imperative language is introduced. The approach, which provides a concrete framework, calledMetateM, for executing temporal formulae, is motivated and illustrated through examples. In addition, this introduction provides references to further, more detailed, work relating to theMetateM approach to executable logics.     

一种分析时序逻辑电路的补充方法

介绍一种分析时序逻辑电路的补充方法,并应用于教学实践中。其特点是原理简单、易于理解、直观方便,相对于传统的分析方法,避免了对次状态方程的分析处理计算,有时比传统方法简便、快捷。通过两个示例展示其优越性。     

基于逻辑器件的可编程增益放大器设计

本文介绍了可编程增益放大器设计的方法。它主要由控制电路、放大电路、显示电路三大模块组成。该系统性能好、成本低、工作可靠,具有一定的工程应用价值,经测试表明,该设计基本上达到了设计的要求。     

Automated synthesis of multiple analog circuits using evolutionary computation for redundancy-based fault-tolerance

Analog circuits are one of the most important parts of modern electronic systems and the failure of electronic hardware presents a critical threat to the completion of modern aircraft, spacecraft, and robot missions. Compared to digital circuits, designing fault-tolerant analog circuits is a difficult and knowledge-intensive task. A simple but powerful method for robustness is a redundancy approach to use multiple circuits instead of single one. For example, if component failures occur, other redundant components can replace the functions of broken parts and the system can still work. However, there are several research issues to make the redundant system automatically. In this paper, we used evolutionary computation to generate multiple analog circuits automatically and then we combined the solutions to generate robust outputs. Evolutionary computation is a natural way to produce multiple redundant solutions because it is a population-based search. Experimental results on the evolution of the low-pass, high-pass and band-stop filters show that the combination of multiple evolved analog circuits produces results that are more robust than those of the best single circuit.     

Majority gates vs. general weighted threshold gates

In this paper we study small depth circuits that contain threshold gates (with or without weights) and parity gates. All circuits we consider are of polynomial size. We prove several results which complete the work on characterizing possible inclusions between many classes defined by small depth circuits. These results are the following: